The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Aug. 04, 2005
Vladimir E. Ostoich, Los Altos, CA (US);
Kenneth Aron, Burlingame, CA (US);
Dennis M. Bleile, San Ramon, CA (US);
Vladimir E. Ostoich, Los Altos, CA (US);
Kenneth Aron, Burlingame, CA (US);
Dennis M. Bleile, San Ramon, CA (US);
Abaxis, Inc., Union City, CA (US);
Abstract
Methods and systems are provided for detecting the accidental use of short and long samples in the clinical analysis of a sample, specimen, or assay. The systems can include a clinical analyzer for determining one or more values for one or more measurable characteristics of a sample. These values are used in combination with reference data stored in a data module to generate a probability that the sample tested is a short sample, a long sample, or an acceptable sample. This probability and/or the status of the sample as a short sample, a long sample, or an acceptable sample are output to a user.