The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Jul. 28, 2004
Applicants:

Marc Joseph Rita Op DE Beeck, Eindhoven, NL;

Fabian Edgar Ernst, Eindhoven, NL;

Inventors:

Marc Joseph Rita Op De Beeck, Eindhoven, NL;

Fabian Edgar Ernst, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-view image generation unit () for generating a multi-view image on basis of an input image is disclosed. The generation unit () comprises: edge detection means () for detecting an edge in the input image; depth map generation means () for generating a depth map for the input image on basis of the edge, a first group of elements of the depth map corresponding to the edge having a first depth value, related to a viewer of the multi-view image, and a second group of elements of the depth map corresponding to a region of the input image, being located adjacent to the edge, having a second depth value, related to the viewer of the multi-view image, the first value being less than the second value; and rendering means () for rendering the multi-view image on basis of the input image and the depth map.


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