The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Oct. 12, 2006
Applicant:

Keishi Ueno, Iruma, JP;

Inventor:

Keishi Ueno, Iruma, JP;

Assignee:

TEAC Corporation, Tama-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 19/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

HMW demodulation is effected more reliably with a simple configuration. A reproduced wobble signal is caused to pass through a BPF previously set to a center frequency 2fwob, to thus enhance a second harmonic component. The wobble signal having passed through a BPF is multiplied by a second harmonic signal. Subsequently, a peak envelope signal and a bottom envelope signal of the multiplied wobble signal are extracted. The peak envelope signal is discriminated from the first preset threshold value. A result of this discrimination becomes a signal used for detecting an HMW[] wobble waveform. Similarly, a bottom envelope signal is discriminated from a preset second threshold value. The result of discrimination becomes a signal used for detecting an HMW[] wobble waveform.


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