The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Oct. 24, 2008
Peter H. Chang, Cupertino, CA (US);
Sami J. Saab, San Francisco, CA (US);
Natarajan Shankar, San Jose, CA (US);
John A. Koontz, Cupertino, CA (US);
Mark S. Ptak, Livermore, CA (US);
Peter H. Chang, Cupertino, CA (US);
Sami J. Saab, San Francisco, CA (US);
Natarajan Shankar, San Jose, CA (US);
John A. Koontz, Cupertino, CA (US);
Mark S. Ptak, Livermore, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An adaptive optics system is provided, comprising a spatial light modulator configured to modulate an incoming beam with an aberrated wavefront, a beamsplitter configured to receive the modulated beam from the spatial light modulator and to divide the modulated beam into a measurement beam and a reference beam, a spatial filter configured to spatially filter the reference beam, and to interfere the spatially filtered reference beam with the measurement beam to form an interferogram, an imaging device configured to capture an image of the interferogram, and a processor configured to determine the aberrated wavefront and to provide control signals to the spatial light modulator to mitigate aberrations in the aberrated wavefront.