The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Mar. 02, 2007
Mark T. Girard, Hutchinson, MN (US);
Joseph P. Tracy, Hutchinson, MN (US);
Ryan A. Jurgenson, Hutchinson, MN (US);
David R. Swift, Glencoe, MN (US);
Mark T. Girard, Hutchinson, MN (US);
Joseph P. Tracy, Hutchinson, MN (US);
Ryan A. Jurgenson, Hutchinson, MN (US);
David R. Swift, Glencoe, MN (US);
Applied Kinetics, Inc., Hutchinson, MN (US);
Abstract
An optical measurement device for determining at least two parameters of a measurement location of a surface of at least one workpiece positioned in a known coordinate system is described. The device comprises a first light source providing a first measurement beam. The first measurement beam is directed at a first surface of a workpiece. The device also comprises a second light source providing a second measurement beam. The second measurement beam is directed at a second surface of a workpiece facing opposite the first surface. Further, the device comprises a first system of receiving optics. The first system of receiving optics detects the incoming position of the first measurement beam. The first system of receiving optics is positioned on an opposite side of a workpiece from the first light source. Further still, the device comprises a second imaging system. The second system of receiving optics detects the incoming position of the second measurement beam. The second system of receiving optics is positioned on an opposite side of a workpiece from the second light source.