The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Jun. 29, 2006
Fan He, Gurnee, IL (US);
Michael W. Frenzer, Palatine, IL (US);
Fan He, Gurnee, IL (US);
Michael W. Frenzer, Palatine, IL (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A testing apparatus () for an image capture device () includes a liquid crystal device (). The liquid crystal device () includes an array of pixels (), which may actively or passively be changed from a transparent state to an opaque or semi-opaque state. The array of pixels are capable of segmentation into a plurality of predefined regions (), which may be columns () or rows (). A liquid crystal device driver () is configured to actuate the predefined regions (), individually and sequentially, in a sweep pattern across the liquid crystal device. The testing apparatus () may be used to measure a variety of parameters associated with image capture devices, including exposure duration, continuous shutter frequency, and flash-shutter lag. The testing apparatus () is capable of operation in a variety of ambient lighting conditions.