The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Oct. 09, 2007
Applicants:

Toshihiko Ouchi, Sagamihara, JP;

Kousuke Kajiki, Tokyo, JP;

Takeaki Itsuji, Hiratsuka, JP;

Inventors:

Toshihiko Ouchi, Sagamihara, JP;

Kousuke Kajiki, Tokyo, JP;

Takeaki Itsuji, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object information acquisition apparatus for acquiring information on the inside of an object includes an electromagnetic wave generation unit capable of outputting a terahertz wave and of changing the output intensity, an irradiation unit that irradiates an electromagnetic wave onto an object, a scanning unit and a detection unit that detects the electromagnetic wave irradiated onto the object. The scanning unit changes the relative positions of the irradiated electromagnetic wave and the object. The detection unit detects the electromagnetic wave transmitted through or reflected by the object as a result of interaction of the object and the electromagnetic wave.


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