The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2010
Filed:
Oct. 23, 2007
Nathan J. Bialke, Seattle, WA (US);
Austin H. Lesea, Los Gatos, CA (US);
Michael A. Margolese, Jerusalem, IL;
Raymond J. Matteis, Aptos, CA (US);
Nathan J. Bialke, Seattle, WA (US);
Austin H. Lesea, Los Gatos, CA (US);
Michael A. Margolese, Jerusalem, IL;
Raymond J. Matteis, Aptos, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the packet of the atomic particles. The PLD is impacted with the packet of the atomic particles. A change is detected in the value of one or more outputs of the PLD. The change in the value of the output or outputs is a result of the impact of the PLD by one of the atomic particles from the packet. A time interval is determined between the departure of the packet of the atomic particles from the source and the change in the value of the output or outputs.