The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2010

Filed:

Aug. 17, 2006
Applicants:

Thomas A. Rinehart, Durham, NC (US);

Robert L. Wood, Apex, NC (US);

Robert P. Freese, Chapel Hill, NC (US);

Inventors:

Thomas A. Rinehart, Durham, NC (US);

Robert L. Wood, Apex, NC (US);

Robert P. Freese, Chapel Hill, NC (US);

Assignee:

Tredegar Newco, Inc., Richmond, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Optical microstructures, such as microlenses, are fabricated by rotating a cylindrical platform that includes a radiation sensitive layer thereon, about its axis, while simultaneously axially rastering a laser beam across at least a portion of the radiation sensitive layer. The cylindrical platform is also simultaneously translated axially while it is being rotated. The amplitude of the laser beam is continuously varied while rastering. The optical microstructures that are imaged in the radiation sensitive layer can be developed to provide a master for replicating a microlenses.


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