The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Oct. 11, 2006
Applicants:

Jin-hsiung Shen, Kaohsiung, TW;

Arbee L. P. Chen, Taipei, TW;

Inventors:

Jin-Hsiung Shen, Kaohsiung, TW;

Arbee L. P. Chen, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for processing multiple continuous Top-K queries, which is performed between a master server and multiple of slave servers, including steps of: a first step, for arbitrarily selecting the multiple of slave servers and querying and counting up K of accumulated values of which are recorded at most; a second step, for calculating every two adjacent values which have been sent from the same servers to obtain an average value as a threshold; and a third step, for measuring variations of an upper bound and a lower bound for each of the values by using the threshold, and reporting to the master server at a time of the value being in excess of the upper bound or lower than the lower bound for each of the values.


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