The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Mar. 16, 2007
Anh T. Nguyen, Fairfax, VA (US);
Kenneth F. Emigholz, Chevy Chase, MD (US);
Stephen S. Woo, Markham, CA;
Stephen D. Vercher, Anahuac, TX (US);
Steven M. Orsak, Baytown, TX (US);
Perry Alagappan, Houston, TX (US);
Anh T. Nguyen, Fairfax, VA (US);
Kenneth F. Emigholz, Chevy Chase, MD (US);
Stephen S. Woo, Markham, CA;
Stephen D. Vercher, Anahuac, TX (US);
Steven M. Orsak, Baytown, TX (US);
Perry Alagappan, Houston, TX (US);
ExxonMobil Research and Engineering Company, Annandale, NJ (US);
Abstract
The present invention is a method and system for detecting an abnormal event for process units of a Polymers Unit. The method compares the operation of the process units to statistical, engineering or heuristic models. The statistical models are developed by principle components analysis of the normal operation for these units. In addition, the engineering models are based on correlation analysis between variables or simple engineering calculations. If the difference between the operation of a process unit and the normal model result indicates an abnormal condition, then the cause of the abnormal condition is determined and corrected.