The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Apr. 18, 2006
Gene D. Tener, Ovledo, FL (US);
Richard W. Benton, Sr., Altamonte Springs, FL (US);
Timothy Alderson, Winter Spring, FL (US);
Gene D. Tener, Ovledo, FL (US);
Richard W. Benton, Sr., Altamonte Springs, FL (US);
Timothy Alderson, Winter Spring, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method and apparatus for processing imagery using images acquired via any known Electro-Optical (EO) system. In accordance with exemplary embodiments of the present invention, a first frame of data is selected as a template frame (e.g., a given frame). A second frame of data can be captured using the EO system. At least a portion of the second frame can be correlated with the template frame to generate a shift vector. The second frame can then be registered with the template frame by interpolating the second frame using the shift vector and re-sampling at least a portion of the second frame to produce a registered frame. The template frame can also be re-sampled. The registered frame and the re-sampled template frame can then be combined to generate an averaged frame. The averaged frame can be spatially filtered to enhance edges within the averaged frame.