The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Aug. 09, 2006
Applicant:
Kensuke Terakawa, Kanagawa-ken, JP;
Inventor:
Kensuke Terakawa, Kanagawa-ken, JP;
Assignee:
Fujifilm Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of detection of different objects in an input image by application, to partial images cut at different positions in the input image, of a plurality of weak classifiers that evaluate whether a detection target image is an image of a predetermined object based on a histogram of values of characteristic quantities calculated from a plurality of sample images representing the predetermined object, the histogram is extended to multi-dimensions and a criterion for the evaluation by the weak classifiers is a multi-dimensional histogram representing histograms for the different objects in the form of vectors.