The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Mar. 16, 2005
Yasuhisa Sakurai, Neyagawa, JP;
Hideaki Hikawa, Neyagawa, JP;
Shuuichi Taneda, Osaka, JP;
Naomi Eguchi, Suita, JP;
Yasuhisa Sakurai, Neyagawa, JP;
Hideaki Hikawa, Neyagawa, JP;
Shuuichi Taneda, Osaka, JP;
Naomi Eguchi, Suita, JP;
Kurashiki Boseki Kabushiki Kaisha, Kurashiki-shi, JP;
Osaka Bioscience Institute, Suita-shi, JP;
Abstract
In a method for automatically detecting degenerated regions in many stained thin section specimens (), color region information is obtained on a degenerated region and on a non-degenerated region on image data of a standard specimen in a stained thin section slide. Next, color region information is obtained on a non-degenerated region on image data of a specimen. Next, the image data of the specimen is compared with the image data of the standard specimen to calculate a color correction quantity to match tone and brightness of the non-degenerated region in the specimen with the counterparts in the non-degenerated region in the standard specimen, and the image data of the specimen is corrected with the color correction quantity. Next, a degenerated region is extracted in the corrected image data of the specimen based on the color region information in the standard specimen.