The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Dec. 14, 2006
Zhiqiang Chen, Beijing, CN;
Kejun Kang, Beijing, CN;
LI Zhang, Beijing, CN;
Haifeng HU, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Liang LI, Beijing, CN;
Yongshun Xiao, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuanjing LI, Beijing, CN;
Yinong Liu, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Kejun Kang, Beijing, CN;
Li Zhang, Beijing, CN;
Haifeng Hu, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Liang Li, Beijing, CN;
Yongshun Xiao, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuanjing Li, Beijing, CN;
Yinong Liu, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
An X-CT scan system includes a base, an object rotary support, an X-ray generation device and a data acquisition system, wherein one side of the detector is leveled to or beyond the prolong line of the connecting line between the X-ray source of the X-ray generation device and the center of the object rotary support, the length of the beyond portion is less than the radius of the imaging field. The advantage of the invention is in that the invention can reconstruct the entire image of the object by means of X-ray projection data which only covers half of the area of the object. Compared with the traditional CT scan system, half of the detector size can be saved at most. The X-CT scan system is simplified and the projection data amount for scan and computation amount for image reconstruction are also reduced with the reconstructed image quality guaranteed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile