The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Mar. 13, 2008
Nobuaki Ueki, Saitama, JP;
Nobuaki Ueki, Saitama, JP;
FUJINON Corporation, Saitama-shi, JP;
Abstract
A relationship between surface decenter of a lensunder test and surface-decenter comatic aberration and a relationship between surface tilt of the lensunder test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lensunder test is calculated by measuring a transmissive wavefront of a projecting portion, and comatic aberration of the lensunder test is calculated by measuring a transmissive wavefront of a lens portion. The surface-decenter comatic aberration that occurs due to the surface decenter is calculated by subtracting the surface-tilt comatic aberration from the calculated comatic aberration. The surface decenter of the lensunder test is calculated based on the calculated surface-decenter comatic aberration.