The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Dec. 03, 2007
Liang-chia Chen, Taipei County, TW;
Sheng-lih Yeh, Taipei, TW;
Huang-wen Lai, Taipei County, TW;
National Taipei University of Technology, Taipei, TW;
Abstract
A method and apparatus for simultaneously acquiring interferograms created with a plurality of different interference conditions are provided in the present invention. In the present invention, an object beam and a reference beam are used to interfere with each other and there are a plurality of sub-fields of interference simultaneously generated. All the sub-fields of interference can be simultaneously acquired by an image acquiring device with single shooting action so as to form the plurality of interferograms. Moreover, the present invention also provides a method for solving the phase information of the object beam from the interferograms formed by the foregoing said method.