The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Jul. 08, 2008
Applicant:

Kentaro Furusawa, Tokyo, JP;

Inventor:

Kentaro Furusawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection apparatus arranges a light source, a curved surface prism having a curved surface and a plane surface, a metal film placed on the plane surface of the prism to be held adjacently to a test sample, and a reflecting member for reflecting light such that light emitted by the light source enters the prism through the curved surface and is reflected by the metal film, then by the reflecting member, and again by the metal film. The detection apparatus is adapted to detect an optical change in the test sample by means of surface plasmon generated on the metal film. In the detection apparatus, divergent light is made to enter the prism through the curved surface to collimate the incident light by means of the curved surface. The apparatus can suppress the broadening of the resonant bandwidth so as to operate as a monitor with a higher degree of precision.


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