The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Sep. 09, 2008
Carlo Effenhauser, Weinheim, DE;
Erich Haendler, Lampertheim, DE;
Norbert Oranth, Hirschberg, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
The invention relates to a method and an apparatus for analyzing a dry-chemical test element, in particular an immunological test element, wherein, in the method, a dry-chemical test element is analyzed by optical scanning, whereby measurement light beams leaving assay regions of the test element, which are loaded with one or more immobilized optically active substances, with a respective measurement light intensity are detected by a detector device. The method comprises the following steps: during the optical scanning of a first assay region, from which the measurement light beams leave with a first measurement light intensity, a first quantity of light from measurement light beams which impinges on the detector device and a working range of the detector device are adapted to one another by selecting scanning parameters according to a first set of scanning parameters, and during the optical scanning of a second assay region, from which the measurement light beams leave with a second measurement light intensity which differs from the first measurement light intensity, a second quantity of light from measurement light beams which impinges on the detector device and the working range of the detector device are adapted to one another by selecting scanning parameters according to a second set of scanning parameters which differs from the first set of scanning parameters.