The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Mar. 16, 2007
Susumu Hoshiko, Kobe, JP;
Naohiko Matsuo, Kobe, JP;
Katsushi Kobayashi, Kobe, JP;
Norimasa Yamamoto, Kobe, JP;
Susumu Hoshiko, Kobe, JP;
Naohiko Matsuo, Kobe, JP;
Katsushi Kobayashi, Kobe, JP;
Norimasa Yamamoto, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A sample analyzer includes (a) a measuring part for measuring optical information of a sample at first wavelength, second wavelength, and third wavelength, first light of the first wavelength and second light of the second wavelength being absorbed by a second substance but substantially not absorbed by a first substance, and third light of the third wavelength being absorbed by the first substance; and (b) an obtaining part for obtaining content of the first substance in the sample, and content of the second substance in the sample, influence by the second substance being excluded from the content of the first substance, based on the optical information at the first wavelength, second wavelength, and third wavelength measured by the measuring part.