The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Jan. 22, 2008
Applicants:

Kai Waslowski, Emmendigen, DE;

Gerhard Merettig, Sexau, DE;

Inventors:

Kai Waslowski, Emmendigen, DE;

Gerhard Merettig, Sexau, DE;

Assignee:

SICK AG, Waldkrich/Breisgau, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for the detection of an object by means of an optoelectronic apparatus, wherein light rays generated by a light source are incident onto an object as a light bead and the light rays scattered back and/or reflected from the object are detected by a receiver arrangement in accordance with the triangulation principle and an object detection signal including information on a scanning distance between the apparatus and the object is output, with the light rays acting via an imaging element on a pixel array consisting of photodetectors in the receiver arrangement. The method is characterized in that the imaging element is only an array of individual imaging elements positioned before the pixel array and generating a received signal pattern on the pixel array corresponding to a plurality of mutually spaced apart images of the light bead; and in that the information on the scanning distance is determined from the received signal pattern. The present invention furthermore relates to an optoelectronic apparatus for the carrying out of the method.


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