The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
May. 06, 2008
Seizo Suzuki, Funabashi, JP;
Hironobu Mifune, Sendai, JP;
Yoshinori Hayashi, Kawasaki, JP;
Yasuhiro Nihei, Yokohama, JP;
Seizo Suzuki, Funabashi, JP;
Hironobu Mifune, Sendai, JP;
Yoshinori Hayashi, Kawasaki, JP;
Yasuhiro Nihei, Yokohama, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical scan apparatus which deflects a plurality of light beams to scan a write region on a scan surface in a main scan direction is configured to include a light source which has a plurality of emission portions emitting the plurality of light beams arranged two-dimensionally on a plane in parallel to the main scan direction and a sub scan direction perpendicular to the main scan direction; a deflector which deflects the plurality of light beams from the plurality of emission portions; a light receiving element which receives the light beams and outputs a synchronous detection signal in accordance with the received light beams; and a control unit which selectively controls any one of the emission portions to emit a light beam upon each scanning and allows the light beam from the selected emission portion to be incident on the light receiving element via the deflector.