The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Sep. 21, 2007
Applicants:

Moises Cases, Austin, TX (US);

Shiva R. Dasari, Austin, TX (US);

Erdem Matoglu, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Nam H. Pham, Round Rock, TX (US);

Inventors:

Moises Cases, Austin, TX (US);

Shiva R. Dasari, Austin, TX (US);

Erdem Matoglu, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Nam H. Pham, Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.


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