The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Mar. 13, 2006
Applicants:

Keiji Tsukada, Okayama, JP;

Toshihiko Kiwa, Okayama, JP;

Inventors:

Keiji Tsukada, Okayama, JP;

Toshihiko Kiwa, Okayama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a magnetic impedance measurement device comprising an apply coil for generating an alternate magnetic field of variable frequency, a power source for the apply coil, at least one magnetic sensor means comprising a pair of magnetic sensors for detecting orthogonal vector components of a magnetic field generated from a test object, the vector components being parallel to the face of the apply coil, a measurement means for the magnetic sensor for measuring a detected signal from said magnetic sensor mean, the measurement means being located at a distance from the face of the apply coil and facing the test object, a lock-in amplifier circuit for detecting from an output of the measurement means a signal having the same frequency as the frequency of the apply coil and an analysis means for analyzing intensity and phase changes of an output of the magnetic sensor means with the use of an output signal of the lock-in amplifier circuit.


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