The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Apr. 19, 2005
Douglas Gordon Knight, London, CA;
Alex M. W. Verdun, London, CA;
Peter Van-doodewaard, Taylors, SC (US);
Douglas Gordon Knight, London, CA;
Alex M. W. Verdun, London, CA;
Peter Van-Doodewaard, Taylors, SC (US);
Trojan Technologies, London, CA;
Abstract
A process for measuring transmittance of a fluid with first and second radiation wavelengths includes (i) positioning a polychromatic radiation source and a polychromatic radiation sensor in a spaced relationship to define a first thickness of fluid; (ii) detecting a first radiation intensity corresponding to the first wavelength at the first thickness; (iii) detecting a second radiation intensity corresponding to the second wavelength at the first thickness; (iv) altering the first thickness to define a second thickness; (v) detecting a third radiation intensity corresponding to the first wavelength at the second thickness; (vi) detecting a fourth radiation intensity corresponding to the second wavelength at the second thickness; and (vii) calculating radiation transmittance of the fluid in the radiation field from the first radiation intensity, the second radiation intensity, the third radiation intensity and the fourth radiation intensity.