The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Aug. 10, 2006
Mitsutoshi Setou, Hamamatsu, JP;
Shuichi Shimma, Toyonaka, JP;
Takahiro Harada, Uji, JP;
Sadao Takeuchi, Nagaokakyo, JP;
Osamu Furuhashi, Uji, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Yoshikazu Yoshida, Kyotanabe, JP;
Mitsutoshi Setou, Hamamatsu, JP;
Shuichi Shimma, Toyonaka, JP;
Takahiro Harada, Uji, JP;
Sadao Takeuchi, Nagaokakyo, JP;
Osamu Furuhashi, Uji, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Yoshikazu Yoshida, Kyotanabe, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
In a mass spectrometer for carrying out mass analysis while microscopically observing a two-dimensional area of a sample, the observation position for selecting a target portion while observing an image of the samplecaptured with a CCD camerais separated from the analysis position for carrying out the mass analysis of the sampleby delivering laser light from the laser-delivering unitonto the sample. The sampleis placed on a stage, which can be precisely moved between the observation position and the analysis position by a stage-driving mechanism. An observation optical systemcan be set close to the sampleat the observation position, without impeding the flight of the ions generated from the sampleduring the analysis or interfering with a laser-condensing optical system. Thus, the spatial resolution for observation is improved without deteriorating the ion-detecting efficiency.