The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Mar. 19, 2009
Taishi Fukazawa, Tokyo, JP;
Wu Mei, Yokohama, JP;
Yoshihiko Nakano, Yokohama, JP;
Tsuyoshi Kobayashi, Kawasaki, JP;
Itsuko Mizutani, Yokohama, JP;
Hiroyasu Sumino, Tokyo, JP;
Taishi Fukazawa, Tokyo, JP;
Wu Mei, Yokohama, JP;
Yoshihiko Nakano, Yokohama, JP;
Tsuyoshi Kobayashi, Kawasaki, JP;
Itsuko Mizutani, Yokohama, JP;
Hiroyasu Sumino, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
The present invention provides a catalyst having high activity and excellent stability, a process for preparation of the catalyst, a membrane electrode assembly, and a fuel cell. The catalyst of the present invention comprises an electronically conductive support and catalyst fine particles. The catalyst fine particles are supported on the support and are represented by the formula (1): PtRuGeT(1). In the formula, u, x, y and z mean 30 to 60 atm %, 20 to 50 atm %, 0.5 to 20 atm % and 0.5 to 40 atm %, respectively. When the element represented by T is Al, Si, Ni, W, Mo, V or C, the content of the T-element's atoms connected with oxygen bonds is not more than four times as large as that of the T-element's atoms connected with metal bonds on the basis of X-ray photoelectron spectrum (XPS) analysis. When the T-element is Ti, Hf, Sn, Ta, Zr or Nb, the content of the T-element's atoms connected with metal bonds is not more than twice as large as that of the T-element's atoms connected with oxygen bonds on the basis of XPS analysis.