The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Jan. 10, 2007
Michael J. Sailor, La Jolla, CA (US);
Manuel M. Orosco, La Jolla, CA (US);
Claudia Pacholski, Stuttgart, DE;
Gordon M. Miskelly, Avondale, NZ;
Michael J. Sailor, La Jolla, CA (US);
Manuel M. Orosco, La Jolla, CA (US);
Claudia Pacholski, Stuttgart, DE;
Gordon M. Miskelly, Avondale, NZ;
The Regents of the University of California, Oakland, CA (US);
Abstract
The invention provides an optical sensor for detecting chemical reaction activity, including, e.g., enzyme activity and catalytic or reactive molecule activity. An optical sensor of the invention includes a porous photonic film that produces a predetermined spectral reflectance response. In preferred embodiments, the film has a chemical coating (such as a hydrophobic layer) within its pores with an affinity for the reaction product(s) of the catalytic or otherwise reactive analyte A coating can also act as a protective layer in preferred embodiment. A thin substrate susceptible to reaction by at least one analyte of interest is on the surface of the thin film to block pores of the thin film. A method of detecting chemical reaction activity of the invention exposes the optical sensor to an analyte of interest, such as an enzyme or otherwise catalytic or reactive molecule. The optical sensor is subjected to light and the reflectivity spectrum of the optical sensor is monitored for a change indicative of reaction activity. Monitoring can include observation for a visible change or data acquisition via instruments such as a spectrometer for monitoring for a change in interferometric reflectance spectra.