The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Oct. 01, 2007
Lei LI, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Xue-liang Zhai, Shenzhen, CN;
Ming-feng LI, Shenzhen, CN;
Chang-fa Sun, Shenzhen, CN;
Dong LI, Shenzhen, CN;
Yong-zhi Tao, Shenzhen, CN;
Lei Li, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Xue-Liang Zhai, Shenzhen, CN;
Ming-Feng Li, Shenzhen, CN;
Chang-Fa Sun, Shenzhen, CN;
Dong Li, Shenzhen, CN;
Yong-Zhi Tao, Shenzhen, CN;
Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province, CN;
FIH (Hong Kong) Limited, Kowloon, HK;
Abstract
A testing system () is used to test a flip-type electronic device (). The electronic device includes a cover () and a main body (). A hinge () connects with the cover and the main body. The testing system includes a base (), a plummer (), a flipping device () and a control device (). The plummer is fixed on the base for locking the electronic device. The flipping device is fixed on the base for opening and closing the cover of the electronic device. The control device includes an optical fiber sensor () for sensing the movement of the cover of the electronic device. The control device connects with the flipping device so as to control the flipping device.