The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Mar. 24, 2005
Ishai Ben Aroya, Kirkland, WA (US);
Ishai Ben Aroya, Kirkland, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A development environment for computer programs in which programs under test may be instrumented with probe functions. The probe functions are called through a wrapper function structured to comply with restrictive calling conventions of the platform for which the computer program is developed. By complying with the calling convention, proper operation of the computer program is achieved during testing even if an exception handler, or other program element that relies on compliance with the calling convention, is invoked. Once instrumented, the computer program may be tested to determine whether it executes desired logic function to determine the performance of the program or for other test functions.