The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Nov. 01, 2007
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-ming Chang, Markham, CA;
Charlie Song, Markham, CA;
Kevin Chu, Scarborough, CA;
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-Ming Chang, Markham, CA;
Charlie Song, Markham, CA;
Kevin Chu, Scarborough, CA;
KingTiger Technology (Canada) Inc., Markham, Ontario, CA;
Abstract
A system and method for testing an integrated circuit module including multiple integrated circuit devices that provide a data strobe signal associated with at least one data signal provided by the same integrated circuit device. A determination of a test outcome for the integrated circuit module may be made after identifying data valid windows for each integrated circuit device, without having to both identify a common sampling window defined by an intersection of the identified data valid windows and verify that such common sampling window meets specification requirements.