The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Feb. 16, 2007
Kathryn Allyn Bassin, Harpursville, NY (US);
Clyde J. Bearss, Marietta, GA (US);
Linda Marie Clough, South Windsor, CT (US);
Susan Eileen Skrabanek, Talking Rock, GA (US);
Crystal Faye Springer, Marietta, GA (US);
Kathryn Allyn Bassin, Harpursville, NY (US);
Clyde J. Bearss, Marietta, GA (US);
Linda Marie Clough, South Windsor, CT (US);
Susan Eileen Skrabanek, Talking Rock, GA (US);
Crystal Faye Springer, Marietta, GA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and articles of manufacture for analyzing defects associated with a software development project. Descriptions of defects identified during the testing of a software product may be stored in a data structure. One or more of the defects may be identified as data defects. If data defects are determined to be the dominant class of defects in the data structure, the data defects may be analyzed to determine a cause for one or more data defects. For example, the focus areas affected by the defects, the trends over time of the defects, the particular types of the data defects, the stability of the system, etc. may be analyzed to determine a cause for the data defects. Therefore, corrective measures may be taken based on the identified cause of the one or more data defects.