The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Oct. 24, 2005
Applicants:

Hiromi Sutou, Yokohama, JP;

Shuji Fujino, Ayase, JP;

Inventors:

Hiromi Sutou, Yokohama, JP;

Shuji Fujino, Ayase, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data-processing system has at least one computer executing at least one application program and at least one storage device. The computer and the at least one storage device storing data are communicatively connected via a plurality of data transfer paths assigned to each program. A data-processing apparatus is communicatively connected to the data-processing system. The data-processing apparatus includes a system configuration storage unit, an abnormality detection information reception unit, an inspection target selection unit and an inspection result storage unit. The system configuration storage unit stores, in a correlated manner, each component of the data-processing system constituting each data transfer path and a program using each component as a data transfer path. The abnormality detection information reception unit receives abnormality detection information indicating that an abnormality is detected while executing an application program, from the computer. The inspection target selection unit selects an inspection target among the each component as a component correlated with the largest number of application programs. The inspection result storage unit stores a result of inspection for a component selected as the inspection target.


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