The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Dec. 28, 2007
Qing Liu, Shenzhen, CN;
Jun-qi LI, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
An exemplary measuring device () for measuring aspects of objects includes a first contour measuring probe (), a second contour measuring probe () and a processor (). The first contour measuring probe () has a first tip extension () and a first displacement sensor (). The first tip extension () is slidable in a first direction. The first displacement sensor () is used to sense a displacement of the first tip extension (). The second contour measuring probe () has a second tip extension () and a second displacement sensor. The second tip extension () is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (). The processor () is electrically connected to the first displacement sensor () and the second displacement sensor respectively.