The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Nov. 14, 2007
Mikael H. Davidson, Lakewood, OH (US);
Hemant Kanodia, Solon, OH (US);
Thomas Buijs, Quebec, CA;
Claude Lafond, Quebec, CA;
Mikael H. Davidson, Lakewood, OH (US);
Hemant Kanodia, Solon, OH (US);
Thomas Buijs, Quebec, CA;
Claude LaFond, Quebec, CA;
ABB Inc., Cary, NC (US);
Abstract
A system for monitoring and controlling a batch process. The system includes a control system that is operable to control the batch process and to receive measured process variables of the batch process. An analyzer analyzes a material sample from the batch process and generates array data representative of the composition of the material sample. An analyzer controller is operable to collect the array data from the analyzer and the measured process variables from the control system. A software data server running on a computer is operable to retrieve the array data and the measured process variables from the analyzer controller. A software information management system running on the computer is operable to receive the measured process variables and the array data from the data server and to store the measured process variables and the array data in a database in an associated manner.