The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Jun. 27, 2007
Aria Abubakar, North Reading, MA (US);
Tarek Habashy, Burlington, MA (US);
David Alumbaugh, Berkeley, CA (US);
Ping Zhang, Albany, CA (US);
Guozhong Gao, Albany, CA (US);
Jianguo Liu, Quincy, MA (US);
Aria Abubakar, North Reading, MA (US);
Tarek Habashy, Burlington, MA (US);
David Alumbaugh, Berkeley, CA (US);
Ping Zhang, Albany, CA (US);
Guozhong Gao, Albany, CA (US);
Jianguo Liu, Quincy, MA (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
To characterize an earth subterranean structure using a measurement assembly including electromagnetic (EM) receivers and one or more EM sources, measured voltage data collected by EM receivers in response to transmission by one or more EM sources is received. Based on a model, predicted EM data is computed. Inversion is iteratively performed according to a function that computes a difference between the measured voltage data and a product of a term containing the predicted EM data and a term containing distortion data that accounts at least for distortion effect by an environment of the measurement assembly. The inversion is iteratively performed to solve for parameters of the model and the distortion data.