The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Dec. 19, 2005
Trent Ridder, Woddbridge, VA (US);
Shonn Hendee, Albuquerque, NM (US);
Trent Ridder, Woddbridge, VA (US);
Shonn Hendee, Albuquerque, NM (US);
TruTouch Technologies, Inc., Albuquerque, NM (US);
Abstract
The present invention includes apparatuses and methods for mitigating the effects of foreign interferents on analyte measurements. The present invention comprises several interferent mitigation steps. Examples include sample cleaning procedures, detection of the presence of interferents, determination of the identity of interferents, and modification or selection of a multivariate calibration model to mitigate the effects of one or more interferents on analyte measurements. The interferent mitigation steps of the present invention can be applied individually, and in some embodiments can be applied in combination. Some examples of relevant analyte measurements include the noninvasive determination of the presence or concentration of alcohol, glucose, urea, byproducts of alcohol metabolism, and substances of abuse.