The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
May. 27, 2004
Applicants:
Roland Steffen, Bad Endorf, DE;
Ralf Plaumann, Forstern, DE;
Inventors:
Roland Steffen, Bad Endorf, DE;
Ralf Plaumann, Forstern, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A high-frequency measuring system is provided for measuring a test device with a measuring device unit and at least one high-frequency module connected to the measuring device unit. Each high-frequency module is located spatially separated from the measuring device unit and is connected to the measuring device unit via a digital interface.