The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Nov. 29, 2007
Applicants:

Georg Rudolph, Tübingen, DE;

Eberhard Loecklin, Reutlingen, DE;

Inventors:

Georg Rudolph, Tübingen, DE;

Eberhard Loecklin, Reutlingen, DE;

Assignee:

Acterna LLC, Germantown, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus is disclosed for measurement and monitoring of in-band optical signal to noise ratio (OSNR). A two channel optical spectrum analyzer (OSA) is advantageously applied in acquiring wavelength division multiplex (WDM) signal data after it has been split according to polarization, then deriving the in-band OSNR from acquired data due to its narrow bandwidth, selective spectral shape, and capability to analyze two components of a polarized signal simultaneously. The in-band OSNR can be measured without interrupting optical transmission traffic in the network.


Find Patent Forward Citations

Loading…