The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Nov. 30, 2004
Yining Deng, San Mateo, CA (US);
D. Amnon Silverstein, Mountain View, CA (US);
Yining Deng, San Mateo, CA (US);
D. Amnon Silverstein, Mountain View, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method performed by a processing system. The method includes receiving a sequence of frames, each frame comprising a sequence of at least two images, each image at a different image position in the sequence and each pair of adjacent images having an overlap region. A local alignment value is determined for the images of each pair of adjacent image positions of each frame based on minimizing a difference of a desired parameter between the images in the overlap region. Global alignment values are determined for all images at corresponding pairs of adjacent image positions of each frame based on the local alignment values for the images at the corresponding pair of adjacent image positions of each frame. Each global alignment value is applied to at least one image of the images of the corresponding pair of adjacent image positions of each frame.