The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Nov. 23, 2005
Jiang Hsieh, Brookfield, WI (US);
Albert Henry Roger Lonn, Beaconsfield, GB;
Mark Lynn Nyka, Sussex, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Albert Henry Roger Lonn, Beaconsfield, GB;
Mark Lynn Nyka, Sussex, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for expanding a field-of-view of a volumetric computed tomography scan comprises identifying truncated views having projection truncation and non-truncated views without projection truncation based on an average value of one or more edge channels. An estimated missing projection is calculated for each of the truncated views based on at least one neighboring non-truncated view. A projection profile is calculated for each of the truncated views based on the estimated missing projection, and the projection profile provides at least one of attenuation data and projection data for an area outside a field-of-view.