The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Nov. 03, 2006
Applicants:

Jinbo BI, Chester Springs, PA (US);

Senthil Periaswamy, Malvern, PA (US);

Kazunori Okada, Los Angeles, CA (US);

Toshiro Kubota, Lewisburg, PA (US);

Glenn Fung, Madison, WI (US);

Marcos Salganicoff, Philadelphia, PA (US);

R. Bharat Rao, Berwyn, PA (US);

Inventors:

Jinbo Bi, Chester Springs, PA (US);

Senthil Periaswamy, Malvern, PA (US);

Kazunori Okada, Los Angeles, CA (US);

Toshiro Kubota, Lewisburg, PA (US);

Glenn Fung, Madison, WI (US);

Marcos Salganicoff, Philadelphia, PA (US);

R. Bharat Rao, Berwyn, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for computer aided detection of anatomical abnormalities in medical images includes providing a plurality of abnormality candidates and features of said abnormality candidates, and classifying said abnormality candidates as true positives or false positives using a hierarchical cascade of linear classifiers of the form sign(wx+b), wherein x is a feature vector, w is a weighting vector and b is a model parameter, wherein different weights are used to penalize false negatives and false positives, and wherein more complex features are used for each successive stage of said cascade of classifiers.


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