The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Dec. 01, 2008
Applicants:

Omid Ebrahimi Kia, North Bethesda, MD (US);

Krishnamoorthy Subramanyan, Palatine, IL (US);

Paul Meredith Crawn, Iii, Richlandtown, PA (US);

Inventors:

Omid Ebrahimi Kia, North Bethesda, MD (US);

Krishnamoorthy Subramanyan, Palatine, IL (US);

Paul Meredith Crawn, III, Richlandtown, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for generating a panoramic image of part of a target, the apparatus including a source of penetrating radiation and a detector aligned with the source of penetrating radiation. The detector and source of penetrating radiation are rotate-able together with respect to the target. The detector has an array of radiation sensors arranged in rows and columns and is configured to output contents of each radiation sensor in the array of radiation sensors. The apparatus also includes a computer connected to the detector and configured to generate a panoramic image by combining data from sensors in the same row in different columns in different readout intervals, corresponding to different positions of the detector as it rotates with respect to the target. The combined outputs are selected to represent rays of radiation passing through a point on a defined curve. The computer is further configured to alter the defined curve and generate a second panoramic image using the altered curve and combing data from the sensor a second time.


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