The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Jul. 16, 2008
Applicant:

Masayuki Kudo, Tokyo, JP;

Inventor:

Masayuki Kudo, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to realize an X-ray CT apparatus and a scan control method of performing contrast imaging by a helical shuttle scan with a smaller exposure amount. An X-ray CT apparatus for performing contrast imaging by repeating a reciprocating helical scan on a region in a subject repeats the helical shuttle scan (solid-line arrow) including, in shuttle (broken-line arrow) of a helical shuttle scan using an X-ray of a first X-ray dose, a helical scan using an X-ray of a second X-ray dose higher than the first X-ray dose. The start timing of the helical scan using the X-ray of the second X-ray dose is determined on the basis of a change in the CT number of a region of interest of an image captured by a helical scan using the X-ray of the first X-ray dose.


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