The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Jun. 16, 2008
Atsushi Koyanagi, Fukushima, JP;
Hiromasa Sato, Fukushima, JP;
Yukihiro Tao, Fukushima, JP;
Koji Miyasaka, Fukushima, JP;
Atsushi Koyanagi, Fukushima, JP;
Hiromasa Sato, Fukushima, JP;
Yukihiro Tao, Fukushima, JP;
Koji Miyasaka, Fukushima, JP;
Asahi Glass Company, Limited, Tokyo, JP;
Abstract
The present invention provides a wavelength-selective diffraction element, configured such that light having a plurality of wavelengths are incident thereon as incident light, which is provided with: a transparent substrate; a concavo-convex part, formed on the transparent substrate such that concave portions and convex portions are cyclically extended in one direction, and comprised of a first material which is optically isotropic; and a filling part, filling at least the concave portions and comprised of a second material which is optically isotropic. The first material and the second material have no absorbance with respect to the wavelengths of the incident light. The first material and the second material have an identical refractive index with respect to light having a first wavelength which is at least one of the wavelengths of the incident light. The first material and the second material have different refractive indices with respect to light having a second wavelength which is at least one of the wavelengths of the incident light and different from the first wavelength.