The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Feb. 14, 2007
John Richard Desalvo, Satellite Beach, FL (US);
Geoffrey Lynn Burdge, Merritt Island, FL (US);
Bruce W. Fitzgerald, Vail, AZ (US);
Young-kai Chen, Berkley Heights, NJ (US);
Andreas Leven, Gillette, NJ (US);
Peter Delfyett, Geneva, FL (US);
John Richard DeSalvo, Satellite Beach, FL (US);
Geoffrey Lynn Burdge, Merritt Island, FL (US);
Bruce W. FitzGerald, Vail, AZ (US);
Young-Kai Chen, Berkley Heights, NJ (US);
Andreas Leven, Gillette, NJ (US);
Peter Delfyett, Geneva, FL (US);
Harris Corporation, Melbourne, FL (US);
Lucents Technologies Inc., Murray Hills, NJ (US);
University of Central Florida Foundations, Inc., Orlando, FL (US);
Abstract
A method is provided for identifying a contaminant in a gaseous space. The method includes: generating a broadband optical waveform; shaping the optical waveform to match an expected waveform for a known contaminant; and transmitting the shaped optical waveform towards an unknown contaminant. Upon receiving a reflected optical waveform from the unknown contaminant, determining whether the unknown contaminant correlates to the known contaminant based on the reflected waveform.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile