The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Mar. 22, 2005
Hirohiko Tsuzuki, Kanagawa, JP;
Hirohiko Tsuzuki, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to suppress variations in measurement values when measuring a specific binding reaction between a physiologically active substance and a tested substance using a surface plasmon resonance measurement device, so that binding detection data with high reliability is obtained. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film; and exchanging the liquid contained in the above flow channel system, wherein a major axis of the metal film is 0.1 μm or more and 100 μm or less; a molecule interacting with an analyzed molecule is immobilized on the surface of the metal film; the distance between metal films is 200 μm or more and 10 mm or less; and the molecule interacting with the analyzed molecule is not immobilized on any parts other than the metal films.