The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Dec. 06, 2005
Applicants:

Stefan Riebel, Bellheim, DE;

Bruno Robert Thoes, Quierschied, DE;

Manfred Augstein, Mannheim, DE;

Herbert Wieder, Mannheim, DE;

Gregor Bainczyk, Mannheim, DE;

Inventors:

Stefan Riebel, Bellheim, DE;

Bruno Robert Thoes, Quierschied, DE;

Manfred Augstein, Mannheim, DE;

Herbert Wieder, Mannheim, DE;

Gregor Bainczyk, Mannheim, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system. The analysis system comprises an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element, and to produce an electrical connection between the contact surface and the evaluation appliance. The at least one contact element is arranged to move to contact the contact surface of a test element held either in a fixed test element holder or a moveable test element holder, such as a slide. Furthermore, the analysis system has a means for moving the electrical contact element to the electrical contact surface of an analytical test element when the test element holder is in the measurement position.


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