The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Jul. 02, 2008
Applicants:

Shin Takeuchi, Ashigarakami-gun, JP;

Minoru Ohshima, Ashigarakami-gun, JP;

Kazuyuki Tsukamoto, Ashigarakami-gun, JP;

Takao Furuya, Ebina, JP;

Yoshinari Iwaki, Ebina, JP;

Kaoru Yoshida, Ashigarakami-gun, JP;

Inventors:

Shin Takeuchi, Ashigarakami-gun, JP;

Minoru Ohshima, Ashigarakami-gun, JP;

Kazuyuki Tsukamoto, Ashigarakami-gun, JP;

Takao Furuya, Ebina, JP;

Yoshinari Iwaki, Ebina, JP;

Kaoru Yoshida, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring device, wherein a feed-out member feeds out an uppermost one of plural sheet-shaped materials stacked on a base by rotating in contact with the uppermost sheet-shaped material, has a detector that detects a force imparted to the base and the sheet-shaped materials not in contact with the feed-out member, the force being generated by feeding-out the uppermost sheet-shaped material.


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