The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Jul. 26, 2007
Sarah C. Braasch, Richmond, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Rouwaida N. Kanj, Round Rock, TX (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Sani R. Nassif, Austin, TX (US);
Evanthia Papadopoulou, Baldwin Place, NY (US);
Sarah C. Braasch, Richmond, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Rouwaida N. Kanj, Round Rock, TX (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Sani R. Nassif, Austin, TX (US);
Evanthia Papadopoulou, Baldwin Place, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed herein are embodiments of a system and an associated method for analyzing an integrated circuit to determine the value of a particular attribute (i.e., a physical or electrical property) in that integrated circuit. In the embodiments, an open deterministic sequencing technique is used to select a sequence of points representing centers of sample windows in an integrated circuit layout. Then, the value of the particular attribute is determined for each sample window and the results are accumulated in order to infer an overall value for that particular attribute for the entire integrated circuit layout. This sequencing technique has the advantage of allowing additional sample windows to be added and/or the sizes and shapes of the windows to be varied without hindering the quality of the sample.